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Slit scanning beam analyzer system
Slit scanning beam analyzer system

Slit scanning beam analyzer system

Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. was established in 2005 and is committed to the R&D and production of light source testing equipment. Its products are widely used in fields such as optical communications, interferometry, and optical fiber sensing testing, and it is a recognized manufacturer dedicated to optical application products. Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. introduced the world's advanced technology in 2017, conducted in-depth research on laser beam quality analysis and energy distribution, and launched the HY series BPS-GE-0103 beam quality analysis system based on the actual production needs of domestic manufacturers.

Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. was established in 2005 and is committed to the R&D and production of light source testing equipment. Its products are widely used in fields such as optical communications, interferometry, and optical fiber sensing testing, and it is a recognized manufacturer dedicated to optical application products. Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. introduced the world's advanced technology in 2017, conducted in-depth research on laser beam quality analysis and energy distribution, and launched the HY series BPS-GE-0103 beam quality analysis system based on the actual production needs of domestic manufacturers.


HY-BPS-GE-0103 Series---Beam Analyzer System

Slit scanning beam analyzer system (Figure 1) 

Slit scanning beam analyzer system (Figure 2) 

 

Measurement principle

Two orthogonal slits pass the beam in front of a photodetector. The beam passing through the slit strikes the detector, causing a current to be generated. The signal generated by the detector is linearly proportional to the irradiance of the beam passing through the slit. A digital encoder can accurately measure the slit position. The current signal generated by photoluminescence is converted into a digital signal and analyzed, and finally the beam profile of the X-axis and Y-axis is obtained. The slit is equivalent to a physical attenuator, which can prevent the beam applied to the detector from being too strong and saturating the detector.

 

Software interface

Slit scanning beam analyzer system (Figure 3) 

 

Minimum spot size that can be measured for each pulse frequency

BPS-GE-0103

Big drum (HP)

Rotation frequency (Hz)

1.25

2.50

5.00

10.00

Slit speed (μm/msec)

233.25

466.50

933.01

1866.01

Data points for each contour

15

15

15

15

Pulse frequency (kHz)

Minimum beam diameter (μm)

0.5

6998

13995

N/A

N/A

1

3499

6998

13995

N/A

2

1749

3499

6998

13995

3

1166

2333

4665

9330

4

875

1749

3499

6998

5

700

1400

2799

5598

6

583

1166

2333

4665

7

500

1000

1999

3999

8

437

875

1749

3499

9

389

778

1555

3110

10

350

700

1400

2799

11

318

636

1272

2545

12

292

583

1166

2333

13

269

538

1077

2153

14

250

500

1000

1999

15

233

467

933

1866

16

219

437

875

1749

17

206

412

823

1646

18

194

389

778

1555

19

184

368

737

1473

20

175

350

700

1400

21

 

 

167

333

666

1333

22

159

318

636

1272

23

152

304

608

1217

24

146

292

583

1166

25

140

280

560

1120

50

70

140

280

560

100

35

70

140

280

150

23

47

93

187

 

Slit scanning beam analyzer system (Figure 4)

Main features and functions:

· Can measure continuous laser and pulsed laser with repetition frequency greater than 1KHz

· The sampling interval can be adjusted as small as 5.7nm, making it possible to measure very small light spots extremely accurately.

· Can display 2D/3D spot morphology

· Adjustable scanning speed

· 12-bit digital signal acquisition, 35dB high dynamic range, 20Hz maximum scanning frequency

·Support users for secondary development and facilitate integration

· Probe can add power meter option

· Silicon, germanium and pyroelectric detectors are available to cover a wide range of spectral ranges and power levels

· Can measure higher power or focus spots without attenuation

· All BPS-GE-0103 calibrations can be sourced to NIST standards to ensure ultimate accuracy

· Comply with international standards ISO/DIN 11146 and ISO13694.

 

Slit scanning beam analyzer system (Figure 5) 

 

The power that BPS-GE-0103 can measure depends on the wavelength of the laser being measured. The wavelength determines not only the reflectivity at the slit surface but also the energy interaction with the material. Generally speaking, the following three basic wavelength ranges illustrate the power range that a probe can measure.

 

n 3μm-FIR (>20μm): pyroelectric detector maximum 100W.

n 700nm-3μm: pyroelectric detector maximum 25W; germanium detector maximum 1W.

n 190-700mn: pyroelectric detector maximum 3W; silicon detector maximum 1W

 


BPS-GE-0103 specifications

Detector type

Power range

Wavelength range

Aperture

Slit size

Probe size

silicon

~100nW~100mW

190nm-950nm

3.5mm

1.8μm

63mm

9mm

5μm

63mm

25μm

25mm

25μm

100mm

germanium

1μW~100mW

700nm-1800nm

3.5mm

1.8μm

63mm

9mm

5μm

63mm

25μm

12mm

25μm

100mm

Pyroelectricity

100mW~100W

200nm-100μm

9mm

5μm

63mm

25μm

20mm

25μm

100mm


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