Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. was established in 2005 and is committed to the R&D and production of light source testing equipment. Its products are widely used in fields such as optical communications, interferometry, and optical fiber sensing testing, and it is a recognized manufacturer dedicated to optical application products. Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. introduced the world's advanced technology in 2017, conducted in-depth research on laser beam quality analysis and energy distribution, and launched the HY series BPS-GE-0103 beam quality analysis system based on the actual production needs of domestic manufacturers.
Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. was established in 2005 and is committed to the R&D and production of light source testing equipment. Its products are widely used in fields such as optical communications, interferometry, and optical fiber sensing testing, and it is a recognized manufacturer dedicated to optical application products. Shenzhen Haoyuan Optoelectronics Technology Co., Ltd. introduced the world's advanced technology in 2017, conducted in-depth research on laser beam quality analysis and energy distribution, and launched the HY series BPS-GE-0103 beam quality analysis system based on the actual production needs of domestic manufacturers.
HY-BPS-GE-0103 Series---Beam Analyzer System
Measurement principle
Two orthogonal slits pass the beam in front of a photodetector. The beam passing through the slit strikes the detector, causing a current to be generated. The signal generated by the detector is linearly proportional to the irradiance of the beam passing through the slit. A digital encoder can accurately measure the slit position. The current signal generated by photoluminescence is converted into a digital signal and analyzed, and finally the beam profile of the X-axis and Y-axis is obtained. The slit is equivalent to a physical attenuator, which can prevent the beam applied to the detector from being too strong and saturating the detector.
Software interface
Minimum spot size that can be measured for each pulse frequency | ||||
BPS-GE-0103 | Big drum (HP) | |||
Rotation frequency (Hz) | 1.25 | 2.50 | 5.00 | 10.00 |
Slit speed (μm/msec) | 233.25 | 466.50 | 933.01 | 1866.01 |
Data points for each contour | 15 | 15 | 15 | 15 |
Pulse frequency (kHz) | Minimum beam diameter (μm) | |||
0.5 | 6998 | 13995 | N/A | N/A |
1 | 3499 | 6998 | 13995 | N/A |
2 | 1749 | 3499 | 6998 | 13995 |
3 | 1166 | 2333 | 4665 | 9330 |
4 | 875 | 1749 | 3499 | 6998 |
5 | 700 | 1400 | 2799 | 5598 |
6 | 583 | 1166 | 2333 | 4665 |
7 | 500 | 1000 | 1999 | 3999 |
8 | 437 | 875 | 1749 | 3499 |
9 | 389 | 778 | 1555 | 3110 |
10 | 350 | 700 | 1400 | 2799 |
11 | 318 | 636 | 1272 | 2545 |
12 | 292 | 583 | 1166 | 2333 |
13 | 269 | 538 | 1077 | 2153 |
14 | 250 | 500 | 1000 | 1999 |
15 | 233 | 467 | 933 | 1866 |
16 | 219 | 437 | 875 | 1749 |
17 | 206 | 412 | 823 | 1646 |
18 | 194 | 389 | 778 | 1555 |
19 | 184 | 368 | 737 | 1473 |
20 | 175 | 350 | 700 | 1400 |
21
| 167 | 333 | 666 | 1333 |
22 | 159 | 318 | 636 | 1272 |
23 | 152 | 304 | 608 | 1217 |
24 | 146 | 292 | 583 | 1166 |
25 | 140 | 280 | 560 | 1120 |
50 | 70 | 140 | 280 | 560 |
100 | 35 | 70 | 140 | 280 |
150 | 23 | 47 | 93 | 187 |
Main features and functions:
· Can measure continuous laser and pulsed laser with repetition frequency greater than 1KHz
· The sampling interval can be adjusted as small as 5.7nm, making it possible to measure very small light spots extremely accurately.
· Can display 2D/3D spot morphology
· Adjustable scanning speed
· 12-bit digital signal acquisition, 35dB high dynamic range, 20Hz maximum scanning frequency
·Support users for secondary development and facilitate integration
· Probe can add power meter option
· Silicon, germanium and pyroelectric detectors are available to cover a wide range of spectral ranges and power levels
· Can measure higher power or focus spots without attenuation
· All BPS-GE-0103 calibrations can be sourced to NIST standards to ensure ultimate accuracy
· Comply with international standards ISO/DIN 11146 and ISO13694.
The power that BPS-GE-0103 can measure depends on the wavelength of the laser being measured. The wavelength determines not only the reflectivity at the slit surface but also the energy interaction with the material. Generally speaking, the following three basic wavelength ranges illustrate the power range that a probe can measure.
n 3μm-FIR (>20μm): pyroelectric detector maximum 100W.
n 700nm-3μm: pyroelectric detector maximum 25W; germanium detector maximum 1W.
n 190-700mn: pyroelectric detector maximum 3W; silicon detector maximum 1W
BPS-GE-0103 specifications
Detector type | Power range | Wavelength range | Aperture | Slit size | Probe size |
silicon | ~100nW~100mW | 190nm-950nm | 3.5mm | 1.8μm | 63mm |
9mm | 5μm | 63mm | |||
25μm | |||||
25mm | 25μm | 100mm | |||
germanium | 1μW~100mW | 700nm-1800nm | 3.5mm | 1.8μm | 63mm |
9mm | 5μm | 63mm | |||
25μm | |||||
12mm | 25μm | 100mm | |||
Pyroelectricity | 100mW~100W | 200nm-100μm | 9mm | 5μm | 63mm |
25μm | |||||
20mm | 25μm | 100mm |
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