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Slot scanning beam analyzer system
Slot scanning beam analyzer system

Slot scanning beam analyzer system

ShenZhen Hoyatek Co.,Ltd. was established in 2005, dedicated to the development and production of light source test equipment. Its products are widely used in the fields of optical communication, interferometry, and optical fiber sensor testing. It is recognized as a manufacturer dedicated to optical applications. ShenZhen Hoyatek Co.,Ltd. introduced the world's advanced technology in 2017, deeply studied the analysis of laser beam quality and energy distribution, and launched the HY series BPS-GE-0103 beam quality analysis system based on the actual production needs of domestic manufacturers.

ShenZhen Hoyatek Co.,Ltd. was established in 2005, dedicated to the development and production of light source test equipment. Its products are widely used in the fields of optical communication, interferometry, and optical fiber sensor testing. It is recognized as a manufacturer dedicated to optical applications. ShenZhen Hoyatek Co.,Ltd. introduced the world's advanced technology in 2017, deeply studied the analysis of laser beam quality and energy distribution, and launched the HY series BPS-GE-0103 beam quality analysis system based on the actual production needs of domestic manufacturers.


HY-BPS-GE-0103 series---beam analyzer system

Slot scanning beam analyzer system (Figure 1) 

Slot scanning beam analyzer system (Figure 2) 

 

Measuring principle

Two orthogonal slits pass through the beam in front of a photodetector. The light beam passing through the slit illuminates the detector to cause current generation, and the signal generated by the detector is linearly proportional to the irradiance of the light beam passing through the slit. A digital encoder can accurately measure the slit position. The current signal generated by the photoluminescence is converted into a digital signal and analyzed, and finally the X-axis and Y-axis beam profiles are obtained. The slit is equivalent to a physical attenuator, which can prevent the beam from being applied to the detector from being too strong to saturate the detector.

 

software interface

Slot scanning beam analyzer system (Figure 3) 

 

The smallest spot size that can be measured for each pulse frequency

BPS-GE-0103

Big round drum (HP)

Rotation frequency (Hz)

1.25

2.50

5.00

10.00

Slit speed (μm/msec)

233.25

466.50

933.01

1866.01

Data points for each contour

15

15

15

15

Pulse frequency (kHz)

Minimum beam diameter (μm)

0.5

6998

13995

N/A

N/A

1

3499

6998

13995

N/A

2

1749

3499

6998

13995

3

1166

2333

4665

9330

4

875

1749

3499

6998

5

700

1400

2799

5598

6

583

1166

2333

4665

7

500

1000

1999

3999

8

437

875

1749

3499

9

389

778

1555

3110

10

350

700

1400

2799

11

318

636

1272

2545

12

292

583

1166

2333

13

269

538

1077

2153

14

250

500

1000

1999

15

233

467

933

1866

16

219

437

875

1749

17

206

412

823

1646

18

194

389

778

1555

19

184

368

737

1473

20

175

350

700

1400

21

 

 

167

333

666

1333

22

159

318

636

1272

23

152

304

608

1217

24

146

292

583

1166

25

140

280

560

1120

50

70

140

280

560

100

35

70

140

280

150

23

47

93

187

 

Slot scanning beam analyzer system (Figure 4)

Main features and functions:

· Can measure continuous laser and pulsed laser with repetition frequency greater than 1KHz

· The sampling interval can be adjusted as small as 5.7nm, making it extremely accurate to measure very small spots,

· Can display 2D/3D spot shape

· Tunable scanning speed

· 12-bit digital signal acquisition, 35dB high dynamic range, 20Hz maximum scanning frequency

· Support users to carry out secondary development for easy integration

· Probe can add power meter option

· Silicon, germanium and pyroelectric detectors are optional, and the measurement range can cover a wide spectrum range and power level

· Can measure higher power or spot at the focal point without attenuation

· All BPS-GE-0103 calibrations can be based on NIST standards to ensure the final accuracy

· Comply with international standards ISO/DIN 11146 and ISO13694.

 

Slot scanning beam analyzer system (Figure 5) 

 

The power that BPS-GE-0103 can measure depends on the wavelength of the measured laser. The wavelength not only determines the reflectivity on the surface of the slit but also determines the energy interaction with the material. Generally speaking, the following three basic wavelength ranges illustrate the power range that the probe can measure.

 

n 3μm-FIR (>20μm): The maximum pyroelectric detector is 100W.

n 700nm-3μm: Maximum 25W for pyroelectric detectors; 1W maximum for germanium detectors.

n 190-700mn: pyroelectric detector maximum 3W; silicon detector maximum 1W


BPS-GE-0103 specifications

Detector type

Power range

Wavelength range

Aperture

Slit size

Probe size

silicon

~100nW~100mW

190nm-950nm

3.5mm

1.8μm

63mm

9mm

5μm

63mm

25μm

25mm

25μm

100mm

germanium

1μW~100mW

700nm-1800nm

3.5mm

1.8μm

63mm

9mm

5μm

63mm

25μm

12mm

25μm

100mm

Pyroelectric

100mW~100W

200nm-100μm

9mm

5μm

63mm

25μm

20mm

25μm

100mm


Industry Application